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Department of Computer Science and IEEE Signal Processing Society
Joint Seminar

Linear Methods for Classification

Prof. Kar-Ann Toh
School of Electrical and Electronic Engineering
Yonsei University

Date: June 30, 2011 (Thursday)
Time: 10:30 - 11:30 am
Venue: SCT909, Cha Chi Ming Science Tower, Ho Sin Hang Campus

In this talk, we shall first go through a brief account on important developments in pattern classification and subsequently zoom in to a new branch of linear methods for classification. In view of the discrepancy between the frequently adopted least-squares error measure and the actual classification error count needed, we seek a classification error formulation for direct cost minimization. By approximating the nonlinear counting step function using a quadratic link, we show that the classification error rate minimization is deterministically solvable. The approximation is further shown to be useful for Area Under ROC (AUC) optimization in multibiometric fusion. Based on a polynomial model and a single-hidden-layer feedforward network (SLFN) for learning, we provide extensive numerical evidences to support the proposal.

Kar-Ann Toh is a full professor in the School of Electrical and Electronic Engineering at Yonsei University, South Korea. He received the PhD degree from Nanyang Technological University (NTU), Singapore. He worked for two years in the aerospace industry prior to his post-doctoral appointments at research centres in NTU from 1998 to 2002. He was affiliated with Institute for Infocomm Research in Singapore from 2002 to 2005 prior to his current appointment in Korea. His research interests include biometrics, pattern classification, optimization and neural networks. He is a co-inventor of a US patent and has made several PCT filings related to biometric applications. Besides being an active member in publications (PAMI, Machine Learning, Neural Computation etc), Dr. Toh has served as a member of technical program committee for international conferences related to biometrics and artificial intelligence. He is currently an associate editor of Pattern Recognition Letters and a senior member of the IEEE.

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